TFIflex - Flexible Thin Film Inspection Platform

Thin Film PV Cells on flexible substrates offers great promise for the future of Photovoltaics by enabling solutions and applications not possible with traditional crystalline cells. As such, the unique nature of flexible thin film solar cells has placed difficult demands on traditional machine vision solutions. Xiris understands the requirements for inspecting quality markers and integrity checks on reflective surfaces, non-standard form factors, and custom manufacturing methods. Xiris has developed the TFI-flex inspection system to detect defects in flexible thin film PV cells.

The TFI-flex incorporates a unique high-resolution linear imager, an Edge-of-Light sensor, and a multi-spectral structured light generator to inspect defects on Flexible Thin Film PV Cells. The compact design of the TFI-flex ensures easy integration into multiple locations along the production line for new line or retrofit installations.

The TFI-flex system is a fully capable inspection system of checking and verifying surface attributes and flaws (such as voids in anti-reflection / passivation layers, stains, scratches, color variance) as well as structural features and defects (such as dimples, folds, creases, discontinuities, etc.). All attribute and feature inspections are performed inline, at line speed, by a single TFI-flex sensor.

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